《粉末衍射数据阶段识别软件》(Crystal Impact Match!)v1.10b[压缩包]

《粉末衍射数据阶段识别软件》(Crystal Impact Match!)v1.10b[压缩包]
  • 片  名  《粉末衍射数据阶段识别软件》(Crystal Impact Match!)v1.10b[压缩包]
  • 简  介  发行时间: 2011年制作发行: Crystal Impact GbR.语言: 英文
  • 类  别  软件
  • 小  类  行业软件


  • 详细介绍中文名: 粉末衍射数据阶段识别软件英文名: Crystal Impact Match!资源格式: 压缩包版本: v1.10b发行时间: 2011年制作发行: Crystal Impact GbR.语言: 英文简介: Crystal.Impact.Match.v1.10是一款易用的粉末衍射数据阶段识别软件。通过把样本的粉末衍射形态与数据库中的参考形态进行比较,来确定样本所在阶段。通过提升ICSD(无机晶体结构数据库)的检索效率,提高参考模式数据库的价值。
    Match!
    Phase Identification from Powder Diffraction
    Match! is an easy-to-use software for phase identification from powder diffraction data, which has become a daily task in material scientists work. Match! compares the powder diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. Single as well as multiple phases can be identified based on both peak data and raw (profile) data.
    As reference database, you can apply the included free-of-charge COD database and/or ICSD/Retrieve (if you have a valid licence), use any ICDD PDF product, and/or create a user database based on your own diffraction patterns. The user database patterns can be edited manually, imported from peak files, calculated from crystal structure data (e.g. CIF files), or imported from your colleague's user database.
    A list of Match!'s most prominent features can be found here.
    Match! Function List
    Fast single and multiple phase identification from powder diffraction data
    Use free-of-charge reference patterns calculated from the COD (incl. I/Ic), any ICDD PDF database, any ICSD/Retrieve version (released 1993-2002; valid licence required) and/or your own diffraction data (or patterns calculated from crystal structure data (e.g. CIF files)) in phase identification
    Flexible handling of reference databases (incl. user databases); you can easily switch between different reference databases without the necessity to perform a new database indexation
    Create reference databases for X-ray and neutron diffraction e.g. from cif-files
    Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
    Powerful CIF- and ICSD/Retrieve import, incl. calculation of powder pattern, I/Ic and density
    Atomic coordinates available e.g. in the ICSD, the ICDD PDF-4+ or free-of-charge reference data are displayed in the data sheets and included in the CIF- or Textfile-exports (e.g. for Rietveld analysis)
    Displaying of Miller indices (hkl) in diffraction patterns and entry data sheets
    View crystal structures in Diamond with just a few clicks
    Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
    Automatic residual searching with respect to identified phases
    Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
    Automatic optimization of peak searching sensitivity
    Fitting of all (or selected) peak parameters to exp. profile data
    Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
    Semi-quantitative analysis (Reference Intensity Ratio method)
    Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
    Integrated database retrieval system and viewer for PDF and user datasheets
    Multiple step undo/redo
    Support for new PDF entry numbers (9 digits)
    User-configurable automatic operation
    Full parameter control with instant rearrangement of the results list
    Automatic d-value shifting during search-match process (optionally)
    Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
    Comfortable graphical and tabular comparison of peak data and candidate patterns
    Mouse-controlled pattern graphics zooming and tracking
  • 《粉末衍射数据阶段识别软件》(Crystal Impact Match!)v1.10b[压缩包]_large